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Texture data of Additively Manufactured Ti-6Al-4V (Different Scanning Strategies)

posted on 16.04.2021, 19:20 by Peter Collins, Maria Quintana-HernandezMaria Quintana-Hernandez, Matthew Kenney, Priyanka Agrawal
Electron Backscatter Diffraction data collected from 3 electron-beam Ti-6-Al-4V AM samples, using 3 different additive manufacturing techniques: raster (L), Dehoff (D) and random (R), at three different heights (bottom, middle and top) of the builds.


Rationalization of Liquid/Solid and Solid/Solid Interphase Instabilities During Thermal-Mechanical Transients of Metal Additive Manufacturing

United States Department of the Navy

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