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Formation of Multilayer Cu Islands Embedded beneath the Surface of Graphite: Characterization and Fundamental Insights

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posted on 22.06.2018, 16:39 by Ann Lii-Rosales, Yong Han, James W. Evans, Dapeng Jing, Yinghui Zhou, Michael C. Tringides, Minsung Kim, Cai-Zhuang Wang, Patricia A. Thiel
The file contains raw scanning tunneling microscopy (STM) images and x-ray photoelectron spectroscopy (XPS) spectra. To view and process STM images, the user can use a software called WSxM. To view XPS spectra, the program CASA XPS is recommended. The STM and XPS data uploaded herein are used to generate figures in the published paper, which can be found in J. Phys. Chem. C 2018, 122, 4454-4469.


U.S. Department of Energy (DOE), Office of Science; DE-AC02-07CH11358 and DE-AC02-05CH11231